CDK offers wide range of evaluation and analysis to meet our customers' needs.
We provide the immediate & flexible service such as electrical measurement, visual inspection (x-ray, SEM, EDS…), chemical etch and so on.
 
								
						Observing Equipment
Stereomicroscope
| Purpose | Expanding the observation image by stereomicroscope. | 
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Metallograph
| Purpose | Expanding the observation image by metallograph. | 
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Digital Microscope
| Purpose | Expanding the observation image by digital microscope. | 
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Measuring Equipment
Laser Microscope
 
								| Purpose | Observing the image by scanning the laser. | 
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X-ray Fluorescence Thickness Meter
 
								| Purpose | Measuring thickness and elemental ratio of films. | 
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Inside Inspection
X-ray Analysis Equipment
 
								| Purpose | Taking the fluoroscopic image to observe the inside. | 
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IComponent Analysis
SEM/EDS
 
								| Purpose | Taking the image and analyzing the component. | 
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| Method | 
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ex)component analysis by EDS: interface of solder

Device Processing
Ion Milling
 
								| Purpose | Polishing the surface of the device by noble gas beam. | 
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| Method | 
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Chemical Etching
| Purpose | Etching the plastic package by using mixed acid. | 
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| Method | By difference of plastic composition, the state of dissolving is different. so it may be necessary to do pretest. Please ask us in advance. | 
